Electron microscope

Results: 1259



#Item
601Materials science / Microtechnology / Intermolecular forces / Emerging technologies / Ion track / Polymer / Atomic force microscopy / Electron microscope / Metin Sitti / Nanotechnology / Science / Scientific method

To appear in the IEEE/ASME Advanced Mechatronics Conference, Kobe, Japan, July[removed]High Aspect Ratio Polymer Micro/Nano-Structure Manufacturing using Nanoembossing, Nanomolding and Directed Self-Assembly Metin Sitti

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Source URL: nanolab.me.cmu.edu

Language: English - Date: 2012-11-16 19:15:37
602Semiconductor device fabrication / Electron microscopy / Thin film deposition / Ions / Focused ion beam / Ion beam / Ion source / Fib / Scanning electron microscope / Chemistry / Scientific method / Physics

Plasma-FIB (Focused Ion Beam) The C2MI plasma-FIB is mainly used to perform micro crosssections on samples by using an ion source. The ion source is focused on the sample to obtain a small beam that can etch the surface

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Source URL: www.c2mi.ca

Language: English - Date: 2014-11-24 15:51:29
603Electron microscopy / Microscopy / Microscopes / Fluorescence / Fluorescent dyes / Electron microscope / Transmission electron microscopy / Fluorescence microscope / Immunogold labelling / Chemistry / Scientific method / Biology

Integrated Correlative Microscopy – FEI iCorr

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Source URL: www.charfac.umn.edu

Language: English - Date: 2014-11-19 17:07:19
604Nanotechnology / Intermolecular forces / Atomic force microscopy / Nanoparticle / Electron / Magnetic force microscope / Local oxidation nanolithography / Scanning probe microscopy / Physics / Science

IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 5, NO. 2, JUNE[removed]Controlled Pushing of Nanoparticles: Modeling and Experiments

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Source URL: nanolab.me.cmu.edu

Language: English - Date: 2012-11-16 19:15:36
605Microscopy / Materials science / Scanning probe microscopy / Atomic force microscopy / Optical microscope / Microscope / Optical fiber / AFM probe / Electron microscope / Nanotechnology / Science / Scientific method

Two-Dimensional Vision-Based Autonomous Microparticle Manipulation using a Nanoprobe Chytra Pawashe and Metin Sitti Nanorobotics Laboratory Scaife Hall 305 Department of Mechanical Engineering

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Source URL: nanolab.me.cmu.edu

Language: English - Date: 2012-11-16 19:15:37
606Chemistry / Electron microscope / Scanning electron microscope / Ion beam / Optical microscope / Microscope / Ion milling machine / Electron backscatter diffraction / Focused ion beam / Scientific method / Electron microscopy / Science

Ion Milling: Improving sample preparation The C2MI ion milling tool is mainly used as the final preparation step for metallographic cut (cross-section[removed]mm wide argon ion beam is used mechanically to etch the sample

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Source URL: www.c2mi.ca

Language: English - Date: 2014-11-24 15:47:45
607Spectroscopy / Chemical pathology / American Old West / American folklore / Tombstone /  Arizona / Granite / X-ray fluorescence / Headstone / Scanning electron microscope / Chemistry / Science / Scientific method

Assessing Mechanisms of Granite Decomposition, ASAS 2006 poster

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Source URL: www.statemuseum.arizona.edu

Language: English - Date: 2014-05-05 16:13:17
608Telescope / Electron microscope / Scientific method / Science / Microscope

101 INVENTIONS THAT CHANGED THE WORLD IMMERSIVE GALLERY / Inventions The development and impact of key inventions will be represented in the Immersive Gallery, through thousands of images, video, and animation. In fact,

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Source URL: rocketcenter.com

Language: English - Date: 2014-11-07 17:18:55
609Actinides / Nuclear materials / Electron microscopy / Nuclear reprocessing / Nuclear chemistry / Plutonium / Scanning electron microscope / Radioactive waste / Nuclear fuel / Chemistry / Nuclear technology / Nuclear physics

Electron Microscopy Laboratory Studies of Nuclear Materials The Electron Microscopy Laboratory is equipped with Scanning Electron Microscopes (SEM) and a Transmission Electron Microscope (TEM) adapted for the examination

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Source URL: ec.europa.eu

Language: English - Date: 2013-04-16 09:09:00
610Physics / Electron microscope / Transmission electron microscopy / Microscope / Scanning transmission electron microscopy / Microscopy / Focused ion beam / Scanning electron microscope / Electron / Electron microscopy / Scientific method / Science

PhD Candidate Position at the Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (Karlsruhe, Germany) Nanotechnology requires imaging techniques with nanometer spatial resolution which yield quantitati

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Source URL: www.lem.kit.edu

Language: English - Date: 2014-07-03 04:32:24
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